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About this Materials Science article
Characterization of Thin MgO Films on Ag(001) by Low-Energy Electron Diffraction and Scanning Tunneling Microscopy by Ouvrard, Aimeric; Niebauer, Johannes; Ghalgaoui, Ahmed; Barth, Clemens; Henry, Claude R.; Bourguignon, Bernard is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Ouvrard, Aimeric; Niebauer, Johannes; Ghalgaoui, Ahmed; Barth, Clemens; Henry, Claude R.; Bourguignon, Bernard
- Publisher
- American Chemical Society; American Chemical Society (ACS) (ISSN 1932-7447)
- Published
- 2011
- Field
- Materials Science (Physical Sciences)