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What is Principles of Atomic Force Microscopy about?

Atomic force microscopy (AFM) is a type of scanning probe microscopy with very high resolution, able to resolve fractions of a nanometer. It was invented in 1986 and works by scanning a probe with a sharp tip over a sample surface to measure forces and construct a topographic image. The probe is attached to a flexible cantilever that bends according to Hooke

Author

Giovanni Dove

Language

EN