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About this Engineering article
A Study of Rapid Photothermal Annealing on the Electrical Properties and Reliability of Tantalum Pentoxide by Chen, Y.; Singh, R.; Rajan, K.; Dumin, D.J.; DeBoer, S.; Thakur, R.P.S. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Chen, Y.; Singh, R.; Rajan, K.; Dumin, D.J.; DeBoer, S.; Thakur, R.P.S.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9383)
- Published
- 1999
- Language
- EN
- Field
- Engineering (Physical Sciences)