About this document

Mbist by Naga Nithesh is a document available to read on EtoBox.

The document discusses built-in self-test (BIST) techniques for testing integrated circuits without external test equipment. It covers the goals, basic concepts, and advantages of BIST, as well as types of hardware pattern generators used for BIST including stored patterns, exhaustive patterns, and pseudo-random patterns generated using linear feedback shift registers.

Author

Naga Nithesh

Language

EN