About this scholarly article

1993 IEEE International Symposium on Circuits and Systems - Functional Test Pattern Generation For Asynchronous Circuits by Jar-Shone Ker, ; Yau-Hwang Kuo, ; Bin-Da Liu, is a scholarly article available to read on EtoBox.

Author

Jar-Shone Ker, ; Yau-Hwang Kuo, ; Bin-Da Liu,

Publisher

IEEE

Published

1993