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About this Engineering article
Detection of Charged Particles in Amorphous Silicon Layers by Kaplan, S. N.; Morel, J. R.; Mulera, T. A.; Perez-Mendez, V.; Schnurmacher, G.; Street, R. A. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Kaplan, S. N.; Morel, J. R.; Mulera, T. A.; Perez-Mendez, V.; Schnurmacher, G.; Street, R. A.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0018-9499)
- Published
- 1986
- Language
- EN
- Field
- Engineering (Physical Sciences)