About this Materials Science article
Quantification of Sample Thickness and In-Concentration of InGaAs Quantum Wells by Transmission Measurements in a Scanning Electron Microscope by Volkenandt, T.; Müller, E.; Hu, D.Z.; Schaadt, D.M.; Gerthsen, D. is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Volkenandt, T.; Müller, E.; Hu, D.Z.; Schaadt, D.M.; Gerthsen, D.
- Publisher
- Cambridge University Press; Cambridge University Press (CUP) (ISSN 1431-9276)
- Published
- 2010
- Language
- EN
- Field
- Materials Science (Physical Sciences)