About this scholarly article

SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Laser interferometry method for measuring displacement field of crack tip of bimetal hot-dip specimen by Chen, Jiyong; Asundi, Anand; Lopez, Jose F.; Quan, Chenggen; Chau, Fook Siong; Fernandez, Francisco V.; Lopez-Villegas, Jose Maria; Asundi, Anand; Wong, Brian Stephen; de la Rosa, Jose M.; Lim, Chwee Teck is a scholarly article available to read on EtoBox.

Author

Chen, Jiyong; Asundi, Anand; Lopez, Jose F.; Quan, Chenggen; Chau, Fook Siong; Fernandez, Francisco V.; Lopez-Villegas, Jose Maria; Asundi, Anand; Wong, Brian Stephen; de la Rosa, Jose M.; Lim, Chwee Teck

Publisher

SPIE

Published

2005

Language

EN