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About this Materials Science article
Image and signal processing in electron microscopy: Proceedings of the Sixth Pfefferkorn Conference, Niagara Falls, Canada, 28 April–2 May 1987. Peter W. Hawkes, F. Peter Ottensmeyer, W. Owen Saxton and Azriel Rosenfeld (eds). Scanning Microscopy International, Chicago, U.S.A. (published as ‘Scanning Microscopy Supplement 2, 1988’) by N.J. Long is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- N.J. Long
- Publisher
- Elsevier Science; Elsevier ; Pergamon Press Ltd.; Elsevier BV (ISSN 0739-6260)
- Published
- 1989
- Language
- EN
- Field
- Materials Science (Physical Sciences)