About this scholarly article
2008 IEEE International Conference on Automation Science and Engineering - Method for proposing sort screen thresholds based on modeling etest/sort-class in semiconductor manufacturing by Yip Wai Kuan, ; Lim Chun Chew, ; Lee Wen Jau, is a scholarly article available to read on EtoBox.
- Author
- Yip Wai Kuan, ; Lim Chun Chew, ; Lee Wen Jau,
- Publisher
- IEEE
- Published
- 2008
- Language
- EN