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About this Engineering article

Application of Atomic Force Microscopy to the Study of Size Fluctuation in E-Beam Patterned Quantum Wire Structures by Notomi, Masaya; Nakao, Masashi; Tamamura, Toshiaki is a Engineering article available to read on EtoBox.

It is typically read by researchers, students, and practitioners in Engineering.

Author
Notomi, Masaya; Nakao, Masashi; Tamamura, Toshiaki
Publisher
Institute of Pure and Applied Physics; Japan Society of Applied Physics; IOP Publishing (ISSN 0021-4922)
Published
1993
Field
Engineering (Physical Sciences)

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