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About this Engineering article
Thermal Monitoring and Testing of Electronic Systems by Szckely, V.; Rencz, M.; Pahi, A.; Courtois, B. is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Szckely, V.; Rencz, M.; Pahi, A.; Courtois, B.
- Publisher
- IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 1521-3331)
- Published
- 1999
- Language
- EN
- Field
- Engineering (Physical Sciences)
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