About this scholarly article

Estimation of Analog/RF Parametric Test Metrics Based on a Multivariate Extreme Value Model by Bounceur, Ahcene; Mir, Salvador; Euler, Reinhardt; Beznia, Kamel is a scholarly article available to read on EtoBox.

Author

Bounceur, Ahcene; Mir, Salvador; Euler, Reinhardt; Beznia, Kamel

Publisher

IEEE; Institute of Electrical and Electronics Engineers; Institute of Electrical and Electronics Engineers (IEEE) (ISSN 0278-0070)

Published

2019