About this scholarly article

TENCON 2010 - 2010 IEEE Region 10 Conference - Comparative study of low-leakage SRAM structures using 90nm CMOS technology by Domingo, M E B; Ostia, F I; Reas, R M; Alvarez, A B; Alarcon, L P is a scholarly article available to read on EtoBox.

Author

Domingo, M E B; Ostia, F I; Reas, R M; Alvarez, A B; Alarcon, L P

Publisher

IEEE

Published

2010

Language

EN