About this scholarly article

SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 10 August 2008)] Developments in X-Ray Tomography VI - Sensitivity of x-ray phase tomography based on Talbot and Talbot-Lau interferometer by Momose, Atsushi; Stock, Stuart R.; Yashiro, Wataru; Takeda, Yoshihiro; Maikusa, Norihide is a scholarly article available to read on EtoBox.

Author

Momose, Atsushi; Stock, Stuart R.; Yashiro, Wataru; Takeda, Yoshihiro; Maikusa, Norihide

Publisher

SPIE

Published

2008