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About this Engineering article
Electrical Characterization of Dry and Wet Processed Interface Layer in Ge/High-K Devices by Ding, Y. M.; Misra, D.; Bhuyian, M.; Tapily, K.; Clark, R. D.; Consiglio, S.; Wajda, C. S.; Leusink, G. J. is a Engineering article available to read on EtoBox.
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- Author
- Ding, Y. M.; Misra, D.; Bhuyian, M.; Tapily, K.; Clark, R. D.; Consiglio, S.; Wajda, C. S.; Leusink, G. J.
- Publisher
- The Electrochemical Society; Electrochemical Society, Inc. (ISSN 1938-6737)
- Published
- 2015
- Field
- Engineering (Physical Sciences)