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What is BIST Fault Diagnosis for Phase Change Memory about?

This document presents a BIST-based fault diagnosis method for phase change memory (PCM) that includes an enhanced test algorithm achieving 100% fault coverage and diagnostic accuracy. It introduces a novel storage scheme for fault information to reduce reliance on external testing equipment, thereby improving efficiency and reducing costs. The proposed approach is validated through simulations, demonstrating its effectiveness in identifying and diagnosing faults in both bit-oriented and word-oriented PCM.

Author

wangmogu142857

Language

EN