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About this Engineering article
Fast and precise measurement in the sub-20nm size range using a Scanning Mobility Particle Sizer by Tröstl, Jasmin; Tritscher, Torsten; Bischof, Oliver F.; Horn, Hans-Georg; Krinke, Thomas; Baltensperger, Urs; Gysel, Martin is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- Tröstl, Jasmin; Tritscher, Torsten; Bischof, Oliver F.; Horn, Hans-Georg; Krinke, Thomas; Baltensperger, Urs; Gysel, Martin
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 0021-8502)
- Published
- 2015
- Field
- Engineering (Physical Sciences)