About this scholarly article

Proceedings 20th IEEE VLSI Test Symposium (VTS 2002) - Exploiting dominance and equivalence using fault tuples by Dwarakanath, K.N.; Blanton, R.D. is a scholarly article available to read on EtoBox.

Author

Dwarakanath, K.N.; Blanton, R.D.

Publisher

IEEE Comput. Soc

Published

2002