About this scholarly article

2000 Proceedings. 50th Electronic Components and Technology Conference (Cat. No.00CH37070) - New evaluation method of CSPs board level reliability using strain gauge by Yamaji, Y.; Suzuki, T.; Yamasaki, H.; Ohishi, T.; Chikawa, Y.; Kako, N. is a scholarly article available to read on EtoBox.

Author

Yamaji, Y.; Suzuki, T.; Yamasaki, H.; Ohishi, T.; Chikawa, Y.; Kako, N.

Publisher

IEEE

Published

2000