About this scholarly article

SPIE Proceedings [SPIE Photonics Europe - Strasbourg, France (Monday 7 April 2008)] Optical Micro- and Nanometrology in Microsystems Technology II - Dual-wavelength digital holographic microscopy with sub-nanometer axial accuracy by Kühn, Jonas; Gorecki, Christophe; Asundi, Anand K.; Charrière, Florian; Colomb, Tristan; Osten, Wolfgang; Montfort, Frédéric; Cuche, Etienne; Emery, Yves; Marquet, Pierre; Depeursinge, Christian is a scholarly article available to read on EtoBox.

Author

Kühn, Jonas; Gorecki, Christophe; Asundi, Anand K.; Charrière, Florian; Colomb, Tristan; Osten, Wolfgang; Montfort, Frédéric; Cuche, Etienne; Emery, Yves; Marquet, Pierre; Depeursinge, Christian

Publisher

SPIE

Published

2008