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About this Engineering article
Thickness dependent properties of chemically deposited Bi2S3 thin films by C.D. Lokhande; A.U. Ubale; P.S. Patil is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- C.D. Lokhande; A.U. Ubale; P.S. Patil
- Publisher
- Elsevier Science; Elsevier ; Elsevier Sequoia; Elsevier BV (ISSN 0040-6090)
- Published
- 1997
- Language
- EN
- Field
- Engineering (Physical Sciences)