About this scholarly article

2011 6th IEEE International Symposium on Industrial and Embedded Systems - Assessment of trace-differences in timing analysis for Complex Real-Time Embedded Systems by Lu, Yue; Nolte, Thomas; Bate, Iain; Kraft, Johan; Norstrom, Christer is a scholarly article available to read on EtoBox.

Author

Lu, Yue; Nolte, Thomas; Bate, Iain; Kraft, Johan; Norstrom, Christer

Publisher

IEEE

Published

2011