About this Materials Science article
Focused ion beam deposition of Co71Cr17Pt12and Ni80Fe20on tips for magnetic force microscopy by C. Hyun; A. K. H. Lee; A. D. Lozanne is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- C. Hyun; A. K. H. Lee; A. D. Lozanne
- Publisher
- Institute of Physics; IOP Publishing; Institute of Physics Publishing (ISSN 0957-4484)
- Published
- 2006
- Field
- Materials Science (Physical Sciences)