Opening book details…
About this Materials Science article
Preparation of Atomically Smooth Aluminum Films: Characterization by Transmission Electron Microscopy and Atomic Force Microscopy by Higo, M.; Lu, X.; Mazur, U.; Hipps, K. W. is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Higo, M.; Lu, X.; Mazur, U.; Hipps, K. W.
- Publisher
- American Chemical Society; American Chemical Society (ACS) (ISSN 0743-7463)
- Published
- 1997
- Language
- EN
- Field
- Materials Science (Physical Sciences)
More by Higo, M.; Lu, X.; Mazur, U.; Hipps, K. W.
Browse all works by Higo, M.; Lu, X.; Mazur, U.; Hipps, K. W.