Skip to content

Opening book details…

About this scholarly article

2010 20th International Conference on Pattern Recognition - Detecting Altered Fingerprints by Feng, Jianjiang; Jain, Anil K.; Ross, Arun is a scholarly article available to read on EtoBox.

Author
Feng, Jianjiang; Jain, Anil K.; Ross, Arun
Publisher
IEEE
Published
2010

More by Feng, Jianjiang; Jain, Anil K.; Ross, Arun

Browse all works by Feng, Jianjiang; Jain, Anil K.; Ross, Arun