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About this Materials Science article
Morphological and Crystallographic Defect Properties of Microcrystalline Silicon: a Comparison Between Different Growth Modes by L. Houben; M. Luysberg; P. Hapke; O. Vetterl; F. Finger; R. Carius; H. Wagner is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- L. Houben; M. Luysberg; P. Hapke; O. Vetterl; F. Finger; R. Carius; H. Wagner
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0022-3093)
- Published
- 1998
- Field
- Materials Science (Physical Sciences)
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