2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Impact of near-contact barriers on the subthreshold slope of short-channel CNTFETs

Claus, Martin; Blawid, Stefan; Schroter, Michael

doi:10.1109/sispad.2013.6650599

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2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Impact of near-contact barriers on the subthreshold slope of short-channel CNTFETs

by Claus, Martin, Blawid, Stefan, Schroter, Michael

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Published2013

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2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Impact of near-contact barriers on the subthreshold slope of short-channel CNTFETs by Claus, Martin; Blawid, Stefan; Schroter, Michael is a scholarly article available to read on EtoBox.

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Claus, Martin; Blawid, Stefan; Schroter, Michael

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IEEE

Published

2013

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2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Impact of near-contact barriers on the subthreshold slope of short-channel CNTFETs

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About this scholarly article

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2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) - Impact of near-contact barriers on the subthreshold slope of short-channel CNTFETs

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