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About this scholarly article
SPIE Proceedings [SPIE International Symposium on Optoelectronic Technology and Application 2014 - Beijing, China (Tuesday 13 May 2014)] International Symposium on Optoelectronic Technology and Application 2014: Imaging Spectroscopy; and Telescopes and Large Optics - A compensation alignment method for surface irregularity based on Zernike coefficients by Rolland, Jannick P.; Yan, Changxiang; Kim, Dae Wook; Ma, Wenli; Zheng, Ligong; Li, Lian; Ma, TianMeng is a scholarly article available to read on EtoBox.
- Author
- Rolland, Jannick P.; Yan, Changxiang; Kim, Dae Wook; Ma, Wenli; Zheng, Ligong; Li, Lian; Ma, TianMeng
- Publisher
- SPIE
- Published
- 2014
- Language
- EN