Can I read Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, 32) on EtoBox?

Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, 32) by Kai-hui Chang; Igor L. Markov; Valeria Bertacco is a nonfiction available to read on EtoBox.

What is Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, 32) about?

<p><P>Functional Design Errors in Digital Circuits Diagnosis covers a wide spectrum of innovative methods to automate the debugging process throughout the design flow&#58; from Register-Transfer Level (RTL) all the way to the silicon die. In particular, this book describes&#58; (1) techniques for bug trace minimization that simplify debugging; (2) an RTL error diagnosis method that identifies the root cause of errors directly; (3) a counterexample-guided error-repair framework to automatically fix errors in gate-level and RTL designs; (4) a symmetry-based rewiring technology for fixing electrical errors; (5) an incremental verification system for physical synthesis; and (6) an integrated framework for post-silicon debugging and layout repair. The solutions provided in this book can greatly reduce debugging effort, enhance design quality, and ultimately enable the design and manufacture of more reliable electronic devices.</p>

Who reads Functional Design Errors in Digital Circuits: Diagnosis Correction and Repair (Lecture Notes in Electrical Engineering, 32)?

Author

Kai-hui Chang; Igor L. Markov; Valeria Bertacco

Publisher

Springer Netherlands

Published

2008

Language

EN

ISBN

9789048181124

Category

nonfiction

Subjects

Computer Science, Engineering, Stem