About this scholarly article

2009 9th International Conference on Electronic Measurement & Instruments - The design of general-purpose automatic testing and fault diagnosis system based on VXI bus by Guo, Rui; Wang, Guoqiang; Jiang, Yuhai; Ye, Wei is a scholarly article available to read on EtoBox.

Author

Guo, Rui; Wang, Guoqiang; Jiang, Yuhai; Ye, Wei

Publisher

IEEE

Published

2009

Language

EN