About this scholarly article

2008 Annual Reliability and Maintainability Symposium - Consideration of Burn-In acceleration and effective screening procedure in latest System LSI by Nobuyuki Wakai, ; Yuji Kobira, ; Hidemitsu Egawa, is a scholarly article available to read on EtoBox.

Author

Nobuyuki Wakai, ; Yuji Kobira, ; Hidemitsu Egawa,

Publisher

IEEE

Published

2008