About this scholarly article

2018 International SoC Design Conference (ISOCC) - 2-D Failure Bitmap Compression Using Line Fault Marking Method by Cho, Keewon; Lee, Young-woo; Seo, Sungyoul; Kang, Sungho is a scholarly article available to read on EtoBox.

Author

Cho, Keewon; Lee, Young-woo; Seo, Sungyoul; Kang, Sungho

Publisher

IEEE

Published

2018