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Thermal characterisation of AlGaN/GaN HEMTs grown on silicon and sapphire substrates based on pulsed I-V measurements by Aubry, R.; Jacquet, J.-C.; Dessertenne, B.; Chartier, E.; Adam, D.; Cordier, Y.; Semond, F.; Massies, J.; DiForte-Poisson, M.-A.; Romann, A.; Delage, S. L. is a Engineering article available to read on EtoBox.

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Author
Aubry, R.; Jacquet, J.-C.; Dessertenne, B.; Chartier, E.; Adam, D.; Cordier, Y.; Semond, F.; Massies, J.; DiForte-Poisson, M.-A.; Romann, A.; Delage, S. L.
Publisher
EDP Sciences (ISSN 1286-0042)
Published
2003
Language
EN
Field
Engineering (Physical Sciences)

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Browse all works by Aubry, R.; Jacquet, J.-C.; Dessertenne, B.; Chartier, E.; Adam, D.; Cordier, Y.; Semond, F.; Massies, J.; DiForte-Poisson, M.-A.; Romann, A.; Delage, S. L.