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This document provides an overview of scanning electron microscopy (SEM) capabilities at TWI, including: - SEM imaging using backscattered and secondary electrons to analyze surface topography and chemical composition. - Energy-dispersive X-ray spectroscopy (EDX) and wavelength-dispersive X-ray (WDX) analysis to determine elemental composition. - Electron backscatter diffraction (EBSD) for microstructural analysis including phase distribution, grain size, and texture. - TWI has two SEMs, an environmen

Author

CLSU NANOTECH

Language

EN