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About this Physics and Astronomy article
The effect of interface trapped charge on threshold voltage shift estimation for gamma irradiated MOS device by Jafari, H.; Feghhi, S.A.H.; Boorboor, S. is a Physics and Astronomy article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Physics and Astronomy.
- Author
- Jafari, H.; Feghhi, S.A.H.; Boorboor, S.
- Publisher
- Elsevier Science; Elsevier ; Elsevier Ltd.; Elsevier BV (ISSN 1350-4487)
- Published
- 2015
- Field
- Physics and Astronomy (Physical Sciences)
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