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Can I read A Data Acquisition Methodology for On-chip Repair of Embedded Memories on EtoBox?
A Data Acquisition Methodology for On-chip Repair of Embedded Memories by Dirk Niggemeyer; Elizabeth M. Rudnick is a Computer Science article available to read on EtoBox.
What is A Data Acquisition Methodology for On-chip Repair of Embedded Memories about?
Systems-on-Chips often contain a large amount of embedded memory. In order to obtain sufficiently high yield, efficient diagnosis and repair facilities are needed for the memories. A novel and efficient approach for collecting complete failure data during on-chip memory testing is proposed that can be combined with a row/column reconfiguration algorithm for complete on-chip memory repair. A sequence of diagnostic tests of linear order is utilized that detects and localizes all cells involved in single-cell faults and two-cell coupling faults, such as idempotent coupling faults, and provides this information to on-chip circuitry for memory repair. Failure data are collected at the operating speed of the memory-under-test so that tests can be applied at speed. The data acquisition circuitry evaluates the test results and classifies faults as column failures, coupling faults, or single-cell faults for near-optimal allocation of spare resources. The proposed test and data acquisition algorithm can be realized as compact Built-In Self-Test (BIST) circuitry using standard design libraries.
Who reads A Data Acquisition Methodology for On-chip Repair of Embedded Memories?
It is typically read by researchers, students, and practitioners in Computer Science.
- Author
- Dirk Niggemeyer; Elizabeth M. Rudnick
- Publisher
- ACM
- Published
- 2003
- Language
- EN
- Field
- Computer Science (Physical Sciences)