About this scholarly article

Proceedings. 'Meeting the Tests of Time'., International Test Conference - A pragmatic approach to the design of self-testing circuits by Savaria, Y.; Lague, B.; Kaminska, B. is a scholarly article available to read on EtoBox.

Author

Savaria, Y.; Lague, B.; Kaminska, B.

Publisher

IEEE Comput. Soc. Press

Published

1989

Language

EN