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About this Engineering article
Diffusion studies in Cr-Pt thin films using Auger electron spectroscopy by S. Danyluk; G.E. McGuire; K.M. Koliwad; M.G. Yang is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- S. Danyluk; G.E. McGuire; K.M. Koliwad; M.G. Yang
- Publisher
- Elsevier Science; Elsevier ; Elsevier Sequoia; Elsevier BV (ISSN 0040-6090)
- Published
- 1975
- Field
- Engineering (Physical Sciences)
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