About this scholarly article

2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) - Improving CDM measurements with frequency domain specifications by Barth, Jon; Henry, Leo G.; Richner, John is a scholarly article available to read on EtoBox.

Author

Barth, Jon; Henry, Leo G.; Richner, John

Publisher

IEEE

Published

2016