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About this Materials Science article
Longitudinal Patent Analysis for Nanoscale Science and Engineering: Country, Institution and Technology Field by Zan Huang; Hsinchun Chen; Alan Yip; Gavin Ng; Fei Guo; Zhi-Kai Chen; Mihail C. Roco is a Materials Science article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Materials Science.
- Author
- Zan Huang; Hsinchun Chen; Alan Yip; Gavin Ng; Fei Guo; Zhi-Kai Chen; Mihail C. Roco
- Publisher
- Springer Netherlands; Springer-Verlag; Kluwer Academic Publishers; Springer Science and Business Media LLC; Society for Mining, Metallurgy and Exploration Inc. (ISSN 1388-0764)
- Published
- 2003
- Field
- Materials Science (Physical Sciences)