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About this Engineering article
Study of the Degradation of p–n Diode Characteristics Caused by Small-Angle Grain Boundaries in Multi-Crystalline Silicon Substrate for Solar Cells by Tachibana, Tomihisa; Masuda, Junichi; Imai, Keita; Ogura, Atsushi; Ohshita, Yoshio; Arafune, Koji; Tajima, Michio is a Engineering article available to read on EtoBox.
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- Author
- Tachibana, Tomihisa; Masuda, Junichi; Imai, Keita; Ogura, Atsushi; Ohshita, Yoshio; Arafune, Koji; Tajima, Michio
- Publisher
- Institute of Pure and Applied Physics; Japan Society of Applied Physics; IOP Publishing (ISSN 0021-4922)
- Published
- 2009
- Field
- Engineering (Physical Sciences)