About this scholarly article

Device Research Conference, 2004. 62nd DRC. - Notre Dame, IN, USA (June 21-23, 2004)] Conference Digest [Late News Papers volume included]Device Research Conference, 2004. 62nd DRC. - Scaling issues of n-channel vertical tunnel FET with δp/sup +/ SiGe layer by Bhuwalka, K.K.; Schulze, J.; Eisele, I. is a scholarly article available to read on EtoBox.

Author

Bhuwalka, K.K.; Schulze, J.; Eisele, I.

Publisher

IEEE

Published

2004