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About this Engineering article
Identification of critical buffer traps in Si δ-doped β-Ga2O3 MESFETs by McGlone, Joe F.; Xia, Zhanbo; Joishi, Chandan; Lodha, Saurabh; Rajan, Siddharth; Ringel, Steven; Arehart, Aaron R. is a Engineering article available to read on EtoBox.
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- Author
- McGlone, Joe F.; Xia, Zhanbo; Joishi, Chandan; Lodha, Saurabh; Rajan, Siddharth; Ringel, Steven; Arehart, Aaron R.
- Publisher
- American Institute of Physics; AIP Publishing (ISSN 0003-6951)
- Published
- 2019
- Field
- Engineering (Physical Sciences)