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Electron microscopy study of interfacial structure and reaction of Yba2Cu3O7/Y-ZrO2 films on LaAlO3 substrates by Dai, J. Y.; Kaatz, F. H.; Markworth, P. R.; Buchholz, D. B.; Liu, X.; Chiou, W. A.; Chang, R. P. H. is a Engineering article available to read on EtoBox.

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Author
Dai, J. Y.; Kaatz, F. H.; Markworth, P. R.; Buchholz, D. B.; Liu, X.; Chiou, W. A.; Chang, R. P. H.
Publisher
Cambridge University Press; Cambridge University Press (Materials Research Society); Cambridge University Press (CUP); Research Square (ISSN 0884-2914)
Published
1998
Field
Engineering (Physical Sciences)