Can I read Journey to Data Quality (The MIT Press) on EtoBox?

Journey to Data Quality (The MIT Press) by Yang W. Lee, Leo L. Pipino, James D. Funk, Richard Y. Wang, Y. Lee is a nonfiction available to read on EtoBox.

What is Journey to Data Quality (The MIT Press) about?

A guide for assessing an organization's data quality practice and a roadmap for implementing a viable data and information quality management program, based on rigorous research and drawing on real-world examples.All organizations today confront data quality problems, both systemic and structural. Neither ad hoc approaches nor fixes at the systems leve—installing the latest software or developing an expensive data warehouse—solve the basic problem of bad data quality practices. Journey to Data Quality offers a roadmap that can be used by practitioners, executives, and students for planning and implementing a viable data and information quality management program. This practical guide, based on rigorous research and informed by real-world examples, describes the challenges of data management and provides the principles, strategies, tools, and techniques necessary to meet them. The authors, all leaders in the data quality field for many years, discuss how to make the economic case for data quality and the importance of getting an organization's leaders on board. They outline different approaches for assessing data, both subjectively (by users) and objectively (using sampling and othe

Who reads Journey to Data Quality (The MIT Press)?

Author

Yang W. Lee, Leo L. Pipino, James D. Funk, Richard Y. Wang, Y. Lee

Publisher

MIT Press; The MIT Press

Published

2009

Language

EN

ISBN

9780262513357

Category

nonfiction

Subjects

Management, Business, Science