About this Engineering article
Low frequency noise in 0.12 μm partially and fully depleted SOI technology by François Dieudonné; Sébastien Haendler; Jalal Jomaah; Francis Balestra is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- François Dieudonné; Sébastien Haendler; Jalal Jomaah; Francis Balestra
- Publisher
- Elsevier Science; Elsevier ; Elsevier BV (ISSN 0026-2714)
- Published
- 2003
- Language
- EN
- Field
- Engineering (Physical Sciences)