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About this Engineering article
A Comprehensive Review on the Single Gate, Double Gate, Tri-Gate, and Heterojunction Tunnel FET for Future Generation Devices by P. Hannah Blessy; A. Shenbagavalli; T. S. Arun Samuel is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- P. Hannah Blessy; A. Shenbagavalli; T. S. Arun Samuel
- Publisher
- Springer Science and Business Media LLC
- Published
- 2022
- Language
- EN
- Field
- Engineering (Physical Sciences)
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