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About this Engineering article
Nanoscale two-dimensional patterning on Si(001) by large-area interferometric lithography and anisotropic wet etching by S. C. Lee; S. R. J. Brueck is a Engineering article available to read on EtoBox.
It is typically read by researchers, students, and practitioners in Engineering.
- Author
- S. C. Lee; S. R. J. Brueck
- Publisher
- AVS (American Vacuum Society); American Vacuum Society; American Institute of Physics (ISSN 0734-211X)
- Published
- 2004
- Field
- Engineering (Physical Sciences)