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Detection of Low-level Copper Contamination in P-type Silicon by Means of Microwave Photoconductive Decay Measurements by Yli-Koski, M; Palokangas, M; Haarahiltunen, A; V in l , H; Storg rds, J; Holmberg, H; Sinkkonen, J is a Physics and Astronomy article available to read on EtoBox.

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Author
Yli-Koski, M; Palokangas, M; Haarahiltunen, A; V in l , H; Storg rds, J; Holmberg, H; Sinkkonen, J
Publisher
Institute of Physics; IOP Publishing; Institute of Physics Publishing (ISSN 0953-8984)
Published
2002
Language
EN
Field
Physics and Astronomy (Physical Sciences)

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